2018 IEEE Xplore Subscription Options for Organizations

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Research

Access model
IEEE journal titles
IEEE conference titles
Active & selected archival IEEE Standards
Partner content
Backfile
Full-text documents
Price
Unlimited full-text access and downloads
188
1,700+
3,800+
IET and complimentary access to VDE and Bell Labs Technical Journal
Backfile to 1872 for select titles
More than 4 million
Contact IEEE for a custom quote
*IEL is the only online option to include unlimited IET content, and the only non-standards option to include active and archival IEEE standards. Drafts available separately.
 
IEEE All-Society Periodicals Package (ASPP)
 
IEEE Proceedings Order Plan (POP)
 
IEEE Proceedings Order Plan All (POP ALL)
 
IEEE Journals Library Plus
 
IEEE Conference Library Plus
 
IEEE Computing Library
 
IEEE Communications Library
 
IEEE Enterprise
 
IEEE Power & Energy Library
 


Archives

Access model
IEEE journal titles
IEEE conference titles
Active & selected archival IEEE Standards
Partner content
Backfile
Full-text documents
Price
 
IEEE Journals Archive
 
IEEE Conference Proceedings Archive
 


IEEE Standards

Access model
Active & selected archival IEEE Standards
Backfile
Full-text documents
Price
 
IEEE All-Inclusive Standards Online
 
IEEE Standards Select
 
2017 National Electrical Safety Code® (NESC®)
 


eBooks & eLearning

# of titles
Backlist
Full-text documents/ chapters
Price
 
IEEE-Wiley eBooks Library
 
IEEE-Wiley Telecommunications eBooks Library
 
MIT Press eBooks Library—Computing & Engineering Collection
 
Morgan & Claypool Synthesis eBooks Library
 
Now Publishers Foundations and Trends® Technology eBooks Library
 
IEEE eLearning Library
 
IEEE English for Engineering
 


Additional Content Partners in IEEE Xplore

Access model
Content
Backfile
Full-text documents
Price
 
SMPTE Digital Library
 
MIT Press Journals — Computing & Engineering Collection
 
IBM Journal of Research and Development
 
Journal of Systems Engineering and Electronics
 
Bell Labs Technical Journal Archive
 

Unless otherwise noted, all subscription options use INSPEC bibliographic records, have support provided by IEEE, and are delivered via the IEEE Xplore digital library.